首页> 外文OA文献 >In Situ Surface Voltage Measurements of Dielectrics Under Electron Beam Irradiation
【2h】

In Situ Surface Voltage Measurements of Dielectrics Under Electron Beam Irradiation

机译:电子束辐照下电介质的原位表面电压测量

代理获取
本网站仅为用户提供外文OA文献查询和代理获取服务,本网站没有原文。下单后我们将采用程序或人工为您竭诚获取高质量的原文,但由于OA文献来源多样且变更频繁,仍可能出现获取不到、文献不完整或与标题不符等情况,如果获取不到我们将提供退款服务。请知悉。

摘要

New instrumentation has been developed for non- contact, in vacuo measurements of the electron beam-induced surface voltage as a function of time and position for non- conductive spacecraft materials in a simulated space environment. The novel compact system uses two movable capacitive sensor electrodes to measure surface charge distributions on samples, using a non-contact method that has little effect on charge dissipation from sample. Design details, calibration and characterization measurements of the system are presented, with \u3c1 V to \u3e30 kV surface voltage range, \u3c0.5 V voltage resolution, and \u3c1.5 mm spatial resolution. Used in conjunction with the capabilities of an existing ultrahigh vacuum electron emission test chamber, the new instrumentation facilitates measurements of charge accumulation, bulk resistivity, effects of charge depletion and accumulation on yield measurements, electron induced electrostatic breakdown potentials, radiation induced conductivity effects, and the radial dispersion of surface voltage.Three types of measurements of surface voltage for polyimide (Kapton HNTM) serve to illustrate the research capabilities of the new system: (i) accumulation using a pulsed electron beam, while periodically measuring the surface voltage; (ii) post charging, as deposited charge dissipated to a grounded substrate; and (iii). the evolution of spatial profile resulting from an incident Gaussian beam. Theoretical models for sample charging and discharge are outlined to predict the time, temperature, and electric field dependence of the sample’s net surface voltage.
机译:对于在模拟太空环境中非导电航天器材料的真空和电子束感应表面电压的时间和位置的函数,已经开发了用于非接触的新仪器。这种新颖的紧凑型系统使用两个可移动的电容传感器电极来测量样品上的表面电荷分布,采用的是非接触式方法,该方法对样品中的电荷耗散影响很小。介绍了系统的设计细节,校准和特性测量,表面电压范围为\ u3c1 V至\ u3e30 kV,电压分辨率为\ u3c0.5 V,空间分辨率为\ u3c1.5 mm。与现有超高真空电子发射测试室的功能结合使用,新仪器可方便地测量电荷累积,体电阻率,电荷耗尽和累积对产率测量的影响,电子感应的静电击穿电位,辐射感应的电导率效应以及聚酰亚胺(Kapton HNTM)的三种类型的表面电压测量旨在说明新系统的研究能力:(i)使用脉冲电子束累积,同时定期测量表面电压; (ii)充电后,因为沉积的电荷会散布到接地的基板上;和(iii)。入射高斯光束导致的空间剖面演变。概述了用于样品充放电的理论模型,以预测样品净表面电压的时间,温度和电场依赖性。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号